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Wednesday, October 22, 2008

VHDL timing model for CMOS semicustom
branch-based logic cells
N. Dumitru, R. Nouta
Delft University of Technology Faculty of Electrical Engineering
P.O. Box 5031, 2600 GA Delft, The Netherlands
Abstract
This paper presents a model for characterizing delay in semicustom CMOS logic cells
that accounts for input slew rate and output capacitance loading. The logic cells are
decomposed into branches of series connected transistors. A method for deriving the
model parameters and VHDL modeling of the branches is presented. This method
drastically reduces the number of model parameters required for delay characterization.
1 Introduction
Analog circuit simulators su er from severe memory and execution time constraints and are
hence unsuitable for VLSI circuits. Logic and timing simulators are much faster, but their
accuracy depends upon the accuracy of the model for cell delay. In order to obtain a good
accuracy, the dependence of CMOS cell delay upon both input slope (IS) and output load
must be taken into account. A input slope dependent timing model for characterizing delay
in CMOS logic gates was presented by Mishelo in [1]. In order to reduce the number of
parameters for delay characterization, we decompose the CMOS cells into branches of series
connected transistors, and characterize the branches rather the entire cell. The concept of
branch-modeling schematics is detailed in [2]. The main advantage is the construction of
simulation models for the cells. As each cell is constructed with branches, it is possible to
describe a model for each di erent branch to obtain the corresponding model of the complete
cell. The number of models to develop is therefore drastically reduced and simpli ed: the
di erent branches present 1, 2 or 3 transistors in series, for both n-branch and p-branch
networks [2]. The very long work of designing dedicated models for each cell is therefore
avoided.
Our characterization is based on piece-wise linear tting of the delay model parameters to
a number of Spice3 simulations. The model parameters for each branch are derived from
Spice simulations of the netlist based on cell's layout using lateral interconnect capacitance.
Level-3 transistor model is used. The number of transistors in series has been limited to 3
for both n- and p-branch type.
2 Input Slope Delay Model of the branch
Mishelo 's characterization [1] is based on the observation that CMOS logic gates presents
two di erent modes of switching { named FAST mode and SLOW mode { which depend
upon the relative values of the input slope and output capacitive load (CL). Our model is
based on the observation that branches of p-transistors/n-transistors which charge/discharge
a capacitive load also present fast/slow operation mode. In order to introduce the branch
delay model we consider a circuit made of 2 branches, presented in Figure 1(a), and compare
the output switching in both fast and slow cases.
Figure 2(a) plots the output slope (OS) versus the input slope (IS). The plot data were ob-
tained from Spice3 simulation, the test circuit was implemented in Sea-of-Gates1.
From Figure 2(a) the following features are evident: 1) the critical input slope (CIS) separat-
ing the fast and slow regions depends linearly on the output load; 2) inside the slow region:
for xed load, OS is independent of IS; for xed IS, OS depends linearly on load; 3) inside
the slow region OS lines have all the same slope.
L C
(a)
[ns]
0
[V]
5
output input
DT (b)
Figure 1: Test circuit made of branches (a), de nition of DT (b)
The basis for the two modes of operation are explained as follows: the output is switching in
a fast mode when the input is completely settled before the output starts switching. When
this is the case, only one branch is conducting current while the output is changing. The OS
and output delay depend only on the capacitive load and saturation current of the transistors,
and are independent of the input slope. In the slow switching mode, i.e. long input transition
time, the input is still changing when the output switches. In this case both branches are
conducting current while the output is changing. For large input slopes the output voltage
follows the DC characteristics of the circuit.
0.0 2.0 4.0 6.0 8.0
input slope [ns]
0.5
1.0
1.5
2.0
2.5
output slope [ns]
100 fF
300 fF
500 fF
FAST
SLOW
CIS
(a)
0.0 2.0 4.0 6.0 8.0
input slope [ns]
0.0
2.0
4.0
6.0
DT [ns]
100 fF
300 fF
500 fF
CIS
FAST
SLOW
(b)
Figure 2: Output slope vs. input slope for 2n-branch (a), DT vs. input slope for 2n-branch (b)
Due to the fact that output delay plot is not linear inside the slow switching region, another
geometric quantity named delay time (DT), represented in Figure 1(b), is selected for a
piece-wise linear approximation. The 50% delay can be expressed from DT, IS and OS as
Delay = DT 􀀀
IS
2
􀀀
OS
2
(1)
Other delays than 50% delay can be as well derived, for example, the 40% delay would
be Delay40% = DT 􀀀 0:4  (IS + OS).
1Sea-of-Gates - 1.6 m semicustom CMOS process with two layers of metal used at TU Delft.
Figure 2(b) shows DT versus IS plots for 2n-branch for several loads equally distanced.
Due to the fast and slow regions separation, OS and DT can described by two linear functions,
one for the fast region and the other for the slow region. The two functions are equal on the
fast-slow boundary determined by CIS. Our model to estimate the OS is given by
OS = ( a + b  CL when x  xp (fast mode)
c + d  CL + m  IS when x > xp (slow mode)
(2)
where xp is a linear function on the output load given by
xp =
a 􀀀 c
m
+
b 􀀀 d
m
 CL (3)
and a; b; c; d; and m are OS parameters.
The piece-wise linear approximation for DT is given by
DT = ( a + b  CL +m1  IS when x  xp (fast mode)
c + d  CL + m2  IS when x > xp (slow mode)
(4)
where
xp =
a 􀀀 c
m2 􀀀 m1
+
b 􀀀 d
m2 􀀀 m1
 CL (5)
and a; b; c; d;m1; and m2 are the DT parameters.
3 Branch Switching Particularities
Branch-logic schematics together with branch switching mechanism present some particular-
ities which allows us to reduce the number of characterization parameters and to include the
in
uence of the capacitive loading of the internal nodes into the cell delay. These character-
istics are summarized below:
1) Due to the fact that the branch is made of series connected transistors, the branch maxi-
mum current is limited by the weakest conducting transistor (in semicustom design all tran-
sistors have the same size). In other words, the slowest input slope of the series transistors
dominates.
2) Some delay parameters of the branches are independent of the branch size and depend
only on the branch type and on the CMOS process. For example:
- for OS: m parameter in eq. (2) is the same for all branches.
- for DT: m1 and m2 parameters in eq. (4) are the same for all branches.
- parallel connected branches switching in the same time behave like an equivalent branch
which has the parameters 1=aech = 1=a1+1=a2+  +1=an and 1=bech = 1=b1+1=b2+  +1=bn
for both OS and DT equations (the same formula form parallel connected resistors).
3) A branch connected to an internal node adds a capacitive load to the node. When the
top branch transistor is in cut o , the capacitance which is added is determined only by the
drain capacitance. If the top branch transistor is in saturation and the adjacent one is in cut
o , the added capacitance includes also gate-channel capacitance and source capacitance.
4 VHDL Implementation
Our VHDL simulator (VantageSpreadsheet version 5.015) simulator cannot handle signals of
type record (a bug!), and consequently two separate signals { namely value and slope { have
been used to model a physical wire in our VHDL descriptions.
The interface aspect of the 2n-branch is presented in Figure 3(a). Two auxiliary signals
named wcap (wired-capacitance) and ps (parallel-switching) are added to the branch to cap-
ture the capacitance variation of the internal node and to adapt the branch parameters for
simultaneous switching of parallel connected branches. All VHDL models are compilable
with IEEE 1164 standard. A new function, called resolve branch is used to resolve the wiring
together of the branch outputs. The diagram of the function strength states is presented in
Figure 3(c).
b ps
c_sl
c
b_sl
a a_sl
y_sl y
br2n
4
in
out
inout
value
slope
slope
value
value
slope
slope
value
wcap
(a)
output slope
b
c_sl
c
b_sl
a a_sl
capw y
pp
br2n
y_sl
capw y_sl y capw y_sl y
pp pp
b b
b_sl b_sl
aa_sl aa_sl
open open
open
open
a slope
a value
b slope
b value
a slope
a value
b slope
b value
br1p br1p
output value
(b)
U
W
1 0
H L
Z
D
X
(c)
Figure 3: Interface aspect of 2n-branch (a), example of nand2 gate (b), resolving branch diagram
(c)
5 Results and Conclusions
Table 1 presents the amount of CPU time needed to simulate a chain of 1000 nand2 gates on
a HP 735/9000 machine. Two di erent models were used for the nand gate: a simple delay
model (e.g. y <= a nand b after X ns;), and a nand gate modeled with branches.
simple delay model Branch modeling Spice3
CPU time 0.15 sec 1.533 sec 55 min
Table 1: VHDL simulation CPU time for a chain of 1000 nand2 gates (55 min - estimated time)
When branch-logic style is used to model the nand gate the simulation time increases, but
remains negligible compared to Spice simulation time.
We have presented a method for characterizing delay in semicustom CMOS cell that accounts
for input slope and output load. The method requires a low number of parameters for delay
characterization, and allows delay simulations to be carried out at VHDL simulation speed.
References
1). M.N. Mishelo , "Improved Modeling and Characterization System for Logic Simulation", Proc.
of the IEEE Asic Intl. Conference, 1992.
2). C. Piquet et al., "Low-Power { Low Voltage Standard Cell Libraries", Low Voltage - Low Power
Workshop at ESSCIRC'95, 1995.
3). Navabi Zainalabedin, "Analysis and Modeling of Digital Systems", McGraw-Hill, 1993.

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